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ADC BIST

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Built-in Self-test for SIGMA-DELTA ADCs

Save on your analog test costs of Sigma-Delta ADCs with a purely digital built-in self-test technique.

» Description and functionalities

- Use of purely digital test stimuli easily generated on-chip
- New test injection technique greatly improves fault coverage
- No need of an ATE with analog options

» Technology

Microelectronics

» Performances

- Very low silicon overhead
- No degradation of ADC performance
- Embedded test close to full dynamic range

» Laboratory

TIMA - Techniques de l'informatique et de la Microelectronique pour l'architecture des systemes Intégrés. réf. 100903_Mir_ADCBIST_background_18042011_GB_1

» Application area

ΣΔ ADCs are used in all sectors of the Microelectronics Industry: instrumentation,
automotive, medical, communications …

Interview

The proposed technique allows users to consider a self-testing solution (BIST, Built-in Self-Test) for completely differential sigma-delta convertors. The injection of purely digital test allows for an improvement of the test quality compared to previous techniques.

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